33 results
Environmental Real Time Imaging with 200kV FE Aberration-corrected Analytical Scanning Transmission Electron Microscope (ESTEM) System with an Open Window Gas Injection
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 318-319
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- August 2018
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Evaluation of Environmental Imaging for 200kV Field Emission Cs-corrected Analytical Scanning and Transmission Electron Microscope for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 918-919
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- July 2017
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STEM and TEM: Disparate Magnification Definitions and a Way Out.
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 56-57
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- July 2017
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A Combined Atomic-Resolution STEM and First-Principles Approach Towards Understanding the Origins of the First Solar-System Solids
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 396-397
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- July 2017
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A New Core Facility For Electron And Ion Microscopy At The University Of Arizona
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 64-65
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- July 2017
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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 32-33
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- July 2016
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Revealing the Origin of “Phonon Glass-Electron Crystal” Behavior in Thermoelectric Layered Cobaltate by Accurate Displacement Measurement
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 434-435
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- August 2014
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The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1192-1193
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- August 2013
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Simultaneous Imaging of Surface and Bulk at Atomic Resolution
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 306-307
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- July 2012
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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 388-389
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- July 2012
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Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 374-375
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- July 2012
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Imaging and Spectroscopy of Energy-Related Nanomaterials
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1618-1619
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- July 2011
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Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1298-1299
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- July 2011
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High-resolution SEM Imaging with Aberration Correction for Highly Precise Measurement of Semiconductors
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 930-931
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- July 2011
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Determination of Displacive Modulation of Thermoelectric Ca3Co4O9 by Simultaneous Acquisitions of HAADF and MAADF Images
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1630-1631
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- July 2011
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Performance Characterization of Hitachi HD-2300A STEM with Dual-EDS Configuration
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 942-943
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- July 2010
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Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 610-611
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- July 2010
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High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 128-129
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- July 2010
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High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 102-103
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- July 2010
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Imaging and Spectroscopy of Interfaces and Surfaces with Advanced Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1430-1431
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- July 2010
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